The Ge( 001) (2 x 1) reconstruction: asymmetric dimers and multilayer relaxation observed by grazing incidence X-ray diffraction
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چکیده
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منابع مشابه
X-ray scattering studies of surfactant mediated epitaxial growth of SiÕGeÕSi„001... heterostructures
The strain and morphology of Si/Ge films grown by surfactant mediated molecular beam epitaxy on Si~001! with Bi as the surfactant were studied with grazing-incidence x-ray diffraction, x-ray reflectivity, low-energy electron diffraction, and Auger electron spectroscopy. Bi is observed to prevent the intermixing of Ge and Si layers by inhibiting Ge segregation in Si. Without a surfactant the cri...
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